Nova Measuring Instruments Ltd.
Nova Measuring Instruments Ltd. develops, produces and markets optical metrology solutions comprised of integrated process control metrology systems and stand-alone metrology used in the manufacturing process of semiconductors. Its productions include metrology systems for thin film measurement in chemical mechanical polishing and chemical vapor deposition applications; optical CD and metal line thickness systems for use in post-copper chemical mechanical polishing applications and optical critical dimension systems for lithography and etch applications. Nova Measuring Instruments integrates thickness monitoring system for chemical mechanical polishing process control enables waferto-wafer closed loop control. The company was founded by Giora Dishon and Moshe Finarov in May 1993 and is headquartered in Ness-Ziona, Israel.