Nova Measuring Instruments Ltd. develops, produces and markets metrology systems for process control that are integrated into process equipment tools or used as stand-alone metrology platforms for the global semiconductor manufacturing industry. Its productions include metrology systems for thin film measurement in chemical mechanical polishing and chemical vapor deposition applications; optical CD and metal line thickness systems for use in post-copper chemical mechanical polishing applications and optical critical dimension systems for lithography and etch applications. Nova Measuring Instruments integrates thickness monitoring system for chemical mechanical polishing process control enables waferto-wafer closed loop control. It offers integrated thickness monitoring systems depending on polisher type and end-user requirements. It operates in China, Israel, Japan, Korea, Netherlands, Singapore, Taiwan and United States of America. The company was founded by Giora Dishon in May 1993 and is headquartered in Ness-Ziona, Israel.
Nova Measuring Instruments Ltd.
Weizmann Science Park Einstein Street Building 22, 2nd floor
SIC Code: 3559